Invention Grant
- Patent Title: Determining an alignment characteristic based on distances of features of a printed pattern
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Application No.: US15502302Application Date: 2014-08-25
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Publication No.: US10035366B2Publication Date: 2018-07-31
- Inventor: Xavier Quintero Ruiz , David Gaston Llado
- Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: HP Inc. Patent Department
- International Application: PCT/EP2014/067978 WO 20140825
- International Announcement: WO2016/029925 WO 20160303
- Main IPC: B41J29/393
- IPC: B41J29/393
Abstract:
According to one example, there is provided a method of determining an alignment characteristic of a printhead die installed in a printer. The method comprises controlling the printer to print a predetermined pattern using the printhead die and determining, through analysis of the distance between features of the printed predetermined pattern, alignment characteristics of the printhead die.
Public/Granted literature
- US20170225499A1 DETERMINING AN ALIGNMENT CHARACTERISTIC Public/Granted day:2017-08-10
Information query
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