Invention Grant
- Patent Title: Sample analyzer and sample analysis method
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Application No.: US14670546Application Date: 2015-03-27
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Publication No.: US10036760B2Publication Date: 2018-07-31
- Inventor: Keiichi Yamaguchi , Hiroshi Kurono , Katsushi Kobayashi
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Metrolexis Law Group, PLLC
- Priority: JP2014-068964 20140328
- Main IPC: G01N33/86
- IPC: G01N33/86 ; G06F11/00 ; G01N21/00

Abstract:
A sample analyzer comprises an input to select a sample type to be measured from a plurality of platelet sample types of differing concentrations, a measurement part to obtain optical information of a sample, a processing part that calculates platelet aggregation information from the optical information, and an alarm part. The processing part determines whether the actual measured sample type differs from the inputted sample type based on the optical information from the measurement part, and actuates the alarm part accordingly.
Public/Granted literature
- US20150276769A1 SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD Public/Granted day:2015-10-01
Information query
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