Technologies are generally described for phase measuring profilometry (PMP) using structured light patterns based on orthogonal frequency division multiplexing (OFDM). In some examples, a composite structured light pattern generated using OFDM may be used to illuminate a surface of interest. The surface may reflect a phase-distorted version of the structured light pattern, and the phase-distorted structured light pattern may be processed to recover image and/or height information about the surface. In some embodiments, fast Fourier transform schemes may be used to generate the composite structured light pattern and process the phase-distorted structured light pattern.