- 专利标题: Method and apparatus for measuring magnetic field
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申请号: US14325739申请日: 2014-07-08
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公开(公告)号: US10042021B2公开(公告)日: 2018-08-07
- 发明人: Dae-ho Lee , Sang-young Zho , Joon-soo Kim
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2013-0079905 20130708
- 主分类号: G01R33/387
- IPC分类号: G01R33/387 ; G01R33/565
摘要:
A magnetic field measuring method in a magnetic resonance imaging (MRI) apparatus includes applying a radio frequency (RF) pulse to an object, acquiring first and second echo signals from a first readout gradient according to test gradients having different intensities, acquiring third and fourth echo signals from a second readout gradient according to the test gradients having different intensities, and determining a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals.
公开/授权文献
- US20150008921A1 METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD 公开/授权日:2015-01-08