- 专利标题: Integrated circuit device with gate line crossing fin-type active region
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申请号: US15442859申请日: 2017-02-27
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公开(公告)号: US10043800B2公开(公告)日: 2018-08-07
- 发明人: Changhwa Kim , Kyungin Choi , Hwichan Jun , Inchan Hwang
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si, Gyeonggi-Do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-Do
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2016-0121465 20160922
- 主分类号: H01L21/8234
- IPC分类号: H01L21/8234 ; H01L27/088 ; H01L27/02 ; H01L23/528 ; H01L29/51 ; H01L29/66
摘要:
An integrated circuit device includes a substrate including a device active region, a fin-type active region protruding from the substrate on the device active region, a gate line crossing the fin-type active region and overlapping a surface and opposite sidewalls of the fin-type active region, an insulating spacer disposed on sidewalls of the gate line, a source region and a drain region disposed on the fin-type active region at opposite sides of the gate line, a first conductive plug connected the source or drain regions, and a capping layer disposed on the gate line and extending parallel to the gate line. The capping layer includes a first part overlapping the gate line, and a second part overlapping the insulating spacer. The first and second parts have different compositions with respect to each other. The second part contacts the first part and the first conductive plug.
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