Invention Grant
- Patent Title: Methods of reading data in nonvolatile memory devices and nonvolatile memory devices
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Application No.: US15493326Application Date: 2017-04-21
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Publication No.: US10056152B2Publication Date: 2018-08-21
- Inventor: Wook-Ghee Hahn , Ji-Sang Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2016-0121862 20160923
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/34 ; G11C16/26 ; G11C16/10 ; G11C16/16

Abstract:
In a method of reading data in a nonvolatile memory device including a plurality of memory cells arranged at intersections of a plurality of word-lines and a plurality of bit-lines, a read request on a first word-line of the plurality of word-lines is received, a read operation is performed on a second word-line adjacent to the first word-line and a read operation is performed on the first word-line based on data read from memory cells of the second word-line. The read operation on the first word-line is performed by adjusting a level of recover read voltage applied to the first word-line during the read operation of the first word-line based on at least one of a program state of the data read from memory cells of the second word-line and an operating parameter of the nonvolatile memory device.
Public/Granted literature
- US20180090216A1 METHODS OF READING DATA IN NONVOLATILE MEMORY DEVICES AND NONVOLATILE MEMORY DEVICES Public/Granted day:2018-03-29
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