Invention Grant
- Patent Title: Apparatus and method for measuring a wavelength-dependent optical characteristic of an optical system
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Application No.: US15255490Application Date: 2016-09-02
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Publication No.: US10060825B2Publication Date: 2018-08-28
- Inventor: Aiko Ruprecht , Patrik Erichsen , Daniel Winters
- Applicant: TRIOPTICS GmbH
- Applicant Address: DE Wedel
- Assignee: TRIOPTICS GMBH
- Current Assignee: TRIOPTICS GMBH
- Current Assignee Address: DE Wedel
- Agency: Lucas & Mercanti, LLP
- Agent Klaus P. Stoffel
- Priority: EP15002589 20150902
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01M11/02 ; G01J3/02 ; G01J3/14

Abstract:
An apparatus for measuring a wavelength-dependent optical characteristic of an optical system has a light-pattern generation device which generates a pattern of polychromatic light in an object plane. Together with the optical system, a measuring optical unit images the object plane on a spatially resolving light sensor. A dispersive optical element is arranged in a light path between the optical system and the light sensor in such a way that a plurality of images of the pattern with different wavelengths are generated simultaneously on the light sensor. The evaluation device determines the wavelength-dependent characteristic of the optical system from the plurality of images on the light sensor.
Public/Granted literature
- US20170059447A1 APPARATUS AND METHOD FOR MEASURING A WAVELENGTH-DEPENDENT OPTICAL CHARACTERISTIC OF AN OPTICAL SYSTEM Public/Granted day:2017-03-02
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