Invention Grant
- Patent Title: Eyeglass fitting parameter measurement device and storage medium storing eyeglass fitting parameter measurement program
-
Application No.: US15080051Application Date: 2016-03-24
-
Publication No.: US10067361B2Publication Date: 2018-09-04
- Inventor: Yoshihiro Ozaki , Toru Arikawa , Toshihiro Kobayashi , Yujiro Tochikubo
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Aichi
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Aichi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2013-202570 20130927; JP2013-202630 20130927; JP2013-202631 20130927; JP2013-202632 20130927
- Main IPC: A61B3/10
- IPC: A61B3/10 ; G02C13/00

Abstract:
There is an provided eyeglass fitting parameter measurement device including: a display control unit that displays a front image of an examinee wearing an eyeglass frame and a lateral image of the examinee wearing the eyeglass frame on a display part; and a position information detection unit that detects position information for determining the positions of the examinee's eyes or the eyeglass frame based on one of the front image and the lateral image. The display control unit provides a correspondence indication corresponding to the position information detected by the position information detection unit in a display area for the other of the front image and the lateral image based on the position information.
Public/Granted literature
Information query