Invention Grant
- Patent Title: RF testing system with parallelized processing
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Application No.: US15071513Application Date: 2016-03-16
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Publication No.: US10069578B2Publication Date: 2018-09-04
- Inventor: Chung-Chin Tsai , Chun-Hsien Peng
- Applicant: MediaTek Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H04B17/17
- IPC: H04B17/17 ; H04B17/00 ; H04B17/29

Abstract:
An integrated circuit (IC) is provided. The IC includes: an RF transmitter configured to generate an RF signal when the IC has entered a test mode; an RF receiver configured to receive the RF signal in the test mode; and a computation unit having a plurality of processing units that are parallelized to perform a test procedure of the IC according to the received RF signal to determine one or more test results.
Public/Granted literature
- US20160197685A1 RF TESTING SYSTEM WITH PARALLELIZED PROCESSING Public/Granted day:2016-07-07
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