Invention Grant
- Patent Title: Reducing registration and design vicinity induced noise for intra-die inspection
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Application No.: US15355509Application Date: 2016-11-18
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Publication No.: US10074167B2Publication Date: 2018-09-11
- Inventor: Saibal Banerjee , Ashok Kulkarni , Shaoyu Lu
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hodgson Russ LLP
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
Noise induced by pattern-of-interest (POI) image registration and POI vicinity design patterns in intra-die inspection is reduced. POI are grouped into alignment groups by co-occurrence of proximate registration targets. The alignment groups are registered using the co-occurrence of proximate registration targets. Registration by voting is performed, which can measure a degree that each of the patterns-of-interest is an outlier. POI are grouped into at least one vicinity group with same vicinity design effects.
Public/Granted literature
- US20170161888A1 REDUCING REGISTRATION AND DESIGN VICINITY INDUCED NOISE FOR INTRA-DIE INSPECTION Public/Granted day:2017-06-08
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