Invention Grant
- Patent Title: Apparatus for automated determining of at least two different process parameters
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Application No.: US14283425Application Date: 2014-05-21
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Publication No.: US10078077B2Publication Date: 2018-09-18
- Inventor: Michael Hanko , Angela Eubisch
- Applicant: Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG
- Applicant Address: DE Gerlingen
- Assignee: Endress+Hauser Conducta Gmbh+Co. KG
- Current Assignee: Endress+Hauser Conducta Gmbh+Co. KG
- Current Assignee Address: DE Gerlingen
- Agency: PatServe
- Agent Mark A. Logan
- Priority: DE102013105492 20130528
- Main IPC: C12Q3/00
- IPC: C12Q3/00 ; G01N33/53 ; C12Q1/00

Abstract:
An apparatus for automated determining of at least two different process parameters of a process liquid of a process, especially a bioprocess, comprising: a first measuring cell, which is embodied to provide a first measurement signal dependent on a first process parameter of a first sample of the process liquid; a second measuring cell, which is embodied to provide a second measurement signal dependent on a second process parameter of a second sample of the process liquid; and a control and evaluation system, which serves for monitoring and/or controlling the process, and which is embodied to receive and to process the first and second measurement signals, especially based on the first measurement signal to determine a measured value of the first process parameter and based on the second measurement signal to determine a measured value of the second process parameter; wherein the first measurement signal and the second measurement signal serve different functions in the context of the monitoring and/or controlling of the process. The first process parameter can be a control parameter (critical process parameter, CPP), and the second process parameter can be a product quality parameter (critical quality attribute, CQA) of the process.
Public/Granted literature
- US20140356880A1 APPARATUS FOR AUTOMATED DETERMINING OF AT LEAST TWO DIFFERENT PROCESS PARAMETERS Public/Granted day:2014-12-04
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