- 专利标题: Integrated packaging structure
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申请号: US15447800申请日: 2017-03-02
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公开(公告)号: US10090298B2公开(公告)日: 2018-10-02
- 发明人: Chien-Chung Chen , Sen Mao , Hsin-Liang Lin
- 申请人: TAIWAN SEMICONDUCTOR CO., LTD.
- 申请人地址: TW New Taipei
- 专利权人: TAIWAN SEMICONDUCTOR CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR CO., LTD.
- 当前专利权人地址: TW New Taipei
- 代理机构: Muncy, Geissler, Olds & Lowe, P.C.
- 优先权: TW106201068U 20170120
- 主分类号: H01L23/495
- IPC分类号: H01L23/495 ; H01L27/088 ; H01L29/06 ; H01L29/417
摘要:
An integrated packaging structure is provided. In the package structure, an integrated component body has a first source region, a second source region, a first setting region, and a second setting region, which are separated from each other. A first MOSFET die and a second MOSFET die are located on the first setting region and the second setting region respectively, and have a top surface, a source electrode pad and a gate electrode pad. The source electrode pad and the gate electrode pad are exposed from the top surface and spaced apart from each other. A first source connection element is connected to the source electrode pad of the first MOSFET die and the first source region. A second source connection element is connected to the source electrode pad of the second MOSFET die and the second source region. A gate connection element is connected to the gate electrode pad and a gate region of the integrated component body.
公开/授权文献
- US20180211953A1 INTEGRATED PACKAGING STRUCTURE 公开/授权日:2018-07-26
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