Invention Grant
- Patent Title: Embedded force measurement
-
Application No.: US15656983Application Date: 2017-07-21
-
Publication No.: US10095366B2Publication Date: 2018-10-09
- Inventor: Stephen Brian Lynch , Benjamin Mark Rappoport , Fletcher R. Rothkopf , Paul Stephen Drzaic , Scott Andrew Myers
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agent Joseph F. Guihan; David K. Cole
- Main IPC: G06F3/046
- IPC: G06F3/046 ; G06F1/16 ; G06F3/041

Abstract:
Disclosed embodiments relate to a force detection system that detects force exerted on a flexible display based upon changes in resistance and/or capacitance. In one embodiment, a method includes measuring a baseline comprising a baseline resistance or a baseline capacitance or both of a force measurement layer disposed within or overlaid on the display panel. The method further includes detecting a change in the baseline resistance or the baseline capacitance or both and calculating a change location where the change in the baseline resistance or the baseline capacitance or both occurred. The method also includes calculating a magnitude of the change in the baseline resistance or the baseline capacitance or both.
Public/Granted literature
- US20170322653A1 Embedded Force Measurement Public/Granted day:2017-11-09
Information query