- Patent Title: Methods and apparatus for sensor having fault trip level setting
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Application No.: US14918716Application Date: 2015-10-21
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Publication No.: US10101410B2Publication Date: 2018-10-16
- Inventor: Alexander Latham , Stephen Marshall , Aaron Cook
- Applicant: ALLEGRO MICROSYSTEMS, LLC
- Applicant Address: US NH Manchester
- Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee Address: US NH Manchester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R33/00
Abstract:
Methods and apparatus for a sensor having non-ratiometric fault trip level setting. In embodiments, a sensor has a sensing element with a fixed gain. A signal processing module receives the fault trip level setting and maintains the fault trip level setting constant during changes in the supply voltage.
Public/Granted literature
- US20170115362A1 Methods and Apparatus for Sensor Having Fault Trip Level Setting Public/Granted day:2017-04-27
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