Invention Grant
- Patent Title: Thin film resistive device for use in an integrated circuit, an integrated circuit including a thin film resistive device
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Application No.: US15000006Application Date: 2016-01-18
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Publication No.: US10101414B2Publication Date: 2018-10-16
- Inventor: Jan Kubik , Seamus P. Whiston , Padraig Michael Doran
- Applicant: Analog Devices Global
- Applicant Address: BM Hamilton
- Assignee: Analog Devices Global
- Current Assignee: Analog Devices Global
- Current Assignee Address: BM Hamilton
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: GB1519905.2 20151111
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R33/09

Abstract:
Thin film resistive sensors typically include a number of resistive components. These components should be well matched in order for the sensor to provide accurate readings. When a sensor is incorporated within an integrated circuit, the resistive components may be formed over, or under, metallic traces that form part of other components. As a result, the thin film resistive components are subjected to different levels of stress. This disclosure provides a structure that is arranged to mitigate the effects of stress.
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