发明授权
- 专利标题: Semiconductor devices including a through via structure and methods of forming the same
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申请号: US15403480申请日: 2017-01-11
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公开(公告)号: US10103098B2公开(公告)日: 2018-10-16
- 发明人: Deokyoung Jung , Kwangjin Moon , Byung Lyul Park , Jin Ho An
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel, P.A.
- 优先权: KR10-2016-0003482 20160112
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L23/522 ; H01L23/532 ; H01L23/48
摘要:
Semiconductor devices including a through via structure and methods of forming the same are provided. The semiconductor devices may include a semiconductor substrate including a first surface and a second surface opposite the first surface, a front insulating layer on the first surface of the semiconductor substrate, a back insulating layer on the second surface of the semiconductor substrate, a through via structure extending through the back insulating layer, the semiconductor substrate, and the front insulating layer, a via insulating layer on a side surface of the through via structure, and a contact structure extending through the front insulating layer. The through via structure may include a first region and a second region disposed on the first region. The second region may include a first doping element, and the first region may be substantially free of the first doping element.
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