- 专利标题： Test and measurement instrument using combined signals
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申请号： US12564800申请日： 2009-09-22
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公开(公告)号： US10107649B2公开(公告)日： 2018-10-23
- 发明人: Kenneth P. Dobyns , Kristie L. Veith , Terrance R. Beale
- 申请人： Kenneth P. Dobyns , Kristie L. Veith , Terrance R. Beale
- 申请人地址： US OR Beaverton
- 专利权人： Tektronix, Inc.
- 当前专利权人： Tektronix, Inc.
- 当前专利权人地址： US OR Beaverton
- 代理商 Marger Johnson; Kevin D. Dothager
- 主分类号： H03F1/26
- IPC分类号： H03F1/26 ; G01D5/244
摘要：
A test and measurement instrument including a plurality of digitizers, each digitizer configured to digitize an input signal to generate a digitized signal; a signal processor configured to combine at least two of the digitized signals from the digitizers into a combined signal; and a circuit configured to receive the combined signal.
公开/授权文献
- US20110071795A1 Test and Measurement Instrument Using Combined Signals 公开/授权日：2011-03-24
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