Invention Grant
- Patent Title: Wafer level chip scale semiconductor package
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Application No.: US15431124Application Date: 2017-02-13
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Publication No.: US10109564B2Publication Date: 2018-10-23
- Inventor: Roelf Groenhuis , Leo Van Gemert , Tonny Kamphuis , Jan Gulpen
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP16175983 20160623
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L21/48 ; H01L21/56 ; H01L23/31 ; H01L23/00

Abstract:
This disclosure relates to a method of forming a wafer level chip scale semiconductor package, the method comprising: providing a carrier having a cavity formed therein; forming electrical contacts at a base portion and sidewalls portions of the cavity; placing a semiconductor die in the base of the cavity; connecting bond pads of the semiconductor die to the electrical contacts; encapsulating the semiconductor die; and removing the carrier to expose the electrical contacts, such that the electrical contacts are arranged directly on the encapsulation material.
Public/Granted literature
- US20170372988A1 WAFER LEVEL CHIP SCALE SEMICONDUCTOR PACKAGE Public/Granted day:2017-12-28
Information query
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