发明授权
- 专利标题: Microscope having a correction unit for correcting a variable spherical aberration
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申请号: US15327659申请日: 2015-07-21
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公开(公告)号: US10133063B2公开(公告)日: 2018-11-20
- 发明人: Christian Schulz , Christian Schumann , Cornell Gonschior , Tobias Bauer
- 申请人: Leica Microsystems CMS GmbH
- 申请人地址: DE Wetzlar
- 专利权人: LEICA MICROSYSTEMS CMS GMBH
- 当前专利权人: LEICA MICROSYSTEMS CMS GMBH
- 当前专利权人地址: DE Wetzlar
- 代理机构: Leydig, Voit & Mayer, Ltd.
- 优先权: DE102014110208 20140721
- 国际申请: PCT/EP2015/066649 WO 20150721
- 国际公布: WO2016/012450 WO 20160128
- 主分类号: G02B27/00
- IPC分类号: G02B27/00 ; G02B13/18 ; G02B21/00 ; F21V8/00 ; G02B21/06 ; G02B27/42 ; G02B27/09
摘要:
A microscope includes at least one correction unit arranged in a beam path for correcting a variable spherical aberration. The correction unit has at least one optical correction element that is arranged in a convergent or divergent area of the beam path such that the optical correction element is movable along an optical axis. The at least one optical correction element has at least one correction surface. A part of the at least one correction surface through which the convergent or divergent area of the beam path passes forms a correction-effective surface section whose radial extension crosswise to the optical axis is adjustable by moving the correction element along the optical axis.
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