- 专利标题: Method and system for measuring lens distortion
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申请号: US15728214申请日: 2017-10-09
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公开(公告)号: US10151664B2公开(公告)日: 2018-12-11
- 发明人: Xingyi Chen , Jianjun Xu , Xiliang Niu
- 申请人: Qingdao GoerTek Technology Co.,Ltd.
- 申请人地址: CN Qingdao
- 专利权人: Qingdao GoerTek Technology Co., Ltd.
- 当前专利权人: Qingdao GoerTek Technology Co., Ltd.
- 当前专利权人地址: CN Qingdao
- 代理机构: Moser Taboada
- 优先权: CN201410302056 20140627
- 主分类号: G01M11/02
- IPC分类号: G01M11/02
摘要:
A method for measuring lens distortion, comprising: providing a test card having a dot matrix pattern of K×N dots, wherein the K and the N are both positive integer; obtaining a distorted image of the test card after being distorted by a lens; establishing a planar coordinate system for the distorted image by using a dot at an upper left corner of the distorted image as a coordinate origin, a rightward direction from the origin as a positive direction of axis X, and a downward direction from the origin as a positive direction of axis Y; positioning a center dot of the distorted image and all non-center dots by scanning and searching, and determining coordinate values of the center dot and all the non-center dots in the planar coordinate system; and calculating a distortion amount of the distorted image by using the coordinate values of the center dot and all the non-center dots according to a distortion amount calculation equation for the distorted image, thereby obtaining a distortion amount of the lens. Also disclosed is a system for measuring lens distortion. The measurement method and system accelerates the image processing speed and improves the lens distortion measurement accuracy.
公开/授权文献
- US20180031442A1 METHOD AND SYSTEM FOR MEASURING LENS DISTORTION 公开/授权日:2018-02-01
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