- 专利标题: Exposure apparatus and device manufacturing method
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申请号: US14703138申请日: 2015-05-04
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公开(公告)号: US10151983B2公开(公告)日: 2018-12-11
- 发明人: Hiroaki Takaiwa , Takashi Horiuchi
- 申请人: NIKON CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: NIKON CORPORATION
- 当前专利权人: NIKON CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff PLC
- 优先权: JP2004-026864 20040203
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03B27/42
摘要:
An exposure apparatus includes a projection system having a final optical element via which an exposure beam is projected, an immersion member having an opening through which the exposure beam is projected, liquid supply ports and liquid recovery ports, a stage which is movable below and relative to the projection system and the immersion member, the stage including a holder configured to hold a substrate, and a detection system configured to detect a residual liquid on at least one of the substrate held on the holder of the movable stage and the movable stage. A liquid immersion area that covers only a portion of the upper surface of the substrate is formed on an upper surface of the substrate held on the holder of the movable stage, while supplying immersion liquid via the liquid supply ports and removing the immersion liquid via the liquid recovery ports.
公开/授权文献
- US20150234293A1 EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD 公开/授权日:2015-08-20
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