- 专利标题: Temperature controller of semiconductor wafer
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申请号: US15239062申请日: 2016-08-17
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公开(公告)号: US10157761B2公开(公告)日: 2018-12-18
- 发明人: Kazuhiro Mimura
- 申请人: KELK Ltd.
- 申请人地址: JP Hiratsuka-shi, Kanagawa
- 专利权人: KELK Ltd.
- 当前专利权人: KELK Ltd.
- 当前专利权人地址: JP Hiratsuka-shi, Kanagawa
- 代理机构: Fish & Richardson P.C.
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; H01L21/67 ; G05D23/19
摘要:
A temperature controller for a semiconductor wafer is configured to perform a temperature control on a plurality of temperature adjusters including a reference temperature adjuster to perform a temperature adjustment of the semiconductor wafer, in which a manipulated variable calculator to give a manipulated variable to a master loop and a slave loop includes a master-slave switching unit configured to switch between the master loop and the slave loop and a master-slave cancellation unit configured to cancel a setting of the master loop and the slave loop when a temperature setpoint of the slave loop is set to have a temperature gradient against a temperature setpoint of the master loop.
公开/授权文献
- US20180053668A1 Temperature Controller of Semiconductor Wafer 公开/授权日:2018-02-22
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