Invention Grant
- Patent Title: Spectrum analysis apparatus and calibration method
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Application No.: US15714159Application Date: 2017-09-25
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Publication No.: US10161793B2Publication Date: 2018-12-25
- Inventor: Akira Noda
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JP2016-187457 20160926
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/02 ; G01N21/27 ; G01N30/74 ; G01J3/10 ; G01J3/18 ; G01N21/25 ; G01J3/42
Abstract:
In a spectrum analysis apparatus, a controller controls selection of an adequate the correction device based on a plurality of corrected absorption spectra corrected by a plurality of correction devices acquired in advance for eliminating an effect of stray light.
Public/Granted literature
- US20180087961A1 SPECTRUM ANALYSIS APPARATUS AND CALIBRATION METHOD Public/Granted day:2018-03-29
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