Invention Grant
- Patent Title: Method and apparatus for quantifying properties of an object through magnetic resonance imaging (MRI)
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Application No.: US14938123Application Date: 2015-11-11
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Publication No.: US10168405B2Publication Date: 2019-01-01
- Inventor: Lae-hoon Kang , Dong-hyun Kim , Min-oh Kim , Dong-yeob Han , Do-sik Hwang , Yong-sup Park , Jong-buhm Park , Jae-sung Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Applicant Address: KR Suwon-si KR Seoul
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Current Assignee Address: KR Suwon-si KR Seoul
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0140613 20151006
- Main IPC: G01R33/50
- IPC: G01R33/50 ; G01R33/48 ; G01R33/561

Abstract:
Provided are a method and apparatus for processing a magnetic resonance (MR) image of an object including first and second materials on a magnetic resonance imaging (MRI) apparatus by using multi-parameter mapping including applying to the object a plurality of radio frequency (RF) pulses separated by a first repetition time and a second repetition time, the first repetition time and the second repetition time being determined based on the first material and the second material; undersampling first MR signals corresponding to the first material and second MR signals corresponding to the second material in a K-space; and performing matching between the undersampled first and the undersampled second MR signals and a signal model for the multi-parameter mapping to determine attribute values corresponding to the first and the second materials at at least one point in an MR image of the object.
Public/Granted literature
- US20160131729A1 METHOD AND APPARATUS FOR QUANTIFYING PROPERTIES OF AN OBJECT THROUGH MAGNETIC RESONANCE IMAGING (MRI) Public/Granted day:2016-05-12
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