- 专利标题: Method and device for detecting defects on a display subtrate
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申请号: US15097918申请日: 2016-04-13
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公开(公告)号: US10169855B2公开(公告)日: 2019-01-01
- 发明人: Zhiqiang Wang , Puguo Zhang , Litao Yang , Yanwei Ren , Kunpeng Zhang
- 申请人: BOE TECHNOLOGY GROUP CO., LTD. , Ordos Yuansheng Optoelectronics Co., Ltd.
- 申请人地址: CN Beijing CN Ordos, Inner Mongolia
- 专利权人: BOE TECHNOLOGY GROUP CO., LTD.,Ordos Yuansheng Optoelectronics Co., Ltd.
- 当前专利权人: BOE TECHNOLOGY GROUP CO., LTD.,Ordos Yuansheng Optoelectronics Co., Ltd.
- 当前专利权人地址: CN Beijing CN Ordos, Inner Mongolia
- 代理机构: Nath, Goldberg & Meyer
- 代理商 Joshua B. Goldberg
- 优先权: CN201510212374 20150429
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; G02B21/00 ; G02B21/24 ; G02F1/13 ; H04N5/235 ; H04N5/247 ; G02B21/36
摘要:
The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.
公开/授权文献
- US20160321794A1 Detecting Device and Detecting Method Thereof 公开/授权日:2016-11-03
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