Invention Grant
- Patent Title: XRF analyzer for light element detection
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Application No.: US15171803Application Date: 2016-06-02
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Publication No.: US10175184B2Publication Date: 2019-01-08
- Inventor: Richard Creighton , Steven Morris , Shawn Chin , Sanjay Kamtekar
- Applicant: Moxtek, Inc.
- Applicant Address: US UT Orem
- Assignee: Moxtek, Inc.
- Current Assignee: Moxtek, Inc.
- Current Assignee Address: US UT Orem
- Agency: Thorpe, North & Western, LLP
- Main IPC: G01N23/223
- IPC: G01N23/223 ; H01J35/24
Abstract:
The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
Public/Granted literature
- US20160370307A1 XRF Analyzer for Light Element Detection Public/Granted day:2016-12-22
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