Invention Grant
- Patent Title: Subjective optometry apparatus
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Application No.: US15347915Application Date: 2016-11-10
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Publication No.: US10188282B2Publication Date: 2019-01-29
- Inventor: Michihiro Takii , Masaaki Hanebuchi , Hisashi Ochi
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Aichi
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Aichi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2015-222931 20151113; JP2015-222932 20151113; JP2015-222933 20151113
- Main IPC: A61B3/032
- IPC: A61B3/032 ; A61B3/00 ; A61B3/04 ; A61B3/103 ; A61B3/18 ; G02B27/00 ; A61B3/02 ; A61B3/028 ; A61B3/10

Abstract:
A subjective optometry apparatus includes: a subjective measurer including a light projecting optical system, a corrective optical system including a right-eye corrective optical system and a left-eye corrective optical system, and an optical member for guiding the target light flux corrected by the corrective optical system to an examinee's eye, the subjective measurer subjectively measuring an optical characteristic of the examinee's eye; and an objective measurer including a measurement optical system for emitting measurement light to a fundus of the examinee's eye and for receiving reflected light from the fundus, the objective measurer objectively measuring the optical characteristic of the examinee's eye via the optical member disposed on an optical path of the measurement optical system.
Public/Granted literature
- US20170135572A1 SUBJECTIVE OPTOMETRY APPARATUS Public/Granted day:2017-05-18
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