- 专利标题: System and method for estimating material density
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申请号: US14561662申请日: 2014-12-05
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公开(公告)号: US10192007B2公开(公告)日: 2019-01-29
- 发明人: Michael Anthony Lexa , Meena Ganesh , John Brandon Laflen , John Edward Smaardyk , Donald Kenney Steinman
- 申请人: General Electric Company
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: GE Global Patent Operation
- 主分类号: G01V5/04
- IPC分类号: G01V5/04 ; G01V5/12 ; G06F17/18 ; G06F17/50
摘要:
A method implemented using one or more computer processors for estimating the density of a material in an annular space includes receiving detector data representative of scattered photons resulting from interaction of a material in an annular space with radiation from a radiation source and detected by a plurality of radiation detectors. The technique further includes performing a set of Monte Carlo simulations. The method further includes performing a principal component analysis on the set of Monte Carlo simulations to generate a principal component analysis model of the detector data. The method also includes estimating the density of the material at one or more locations within the annular space based upon the principal component analysis model and the detector data.
公开/授权文献
- US20160162610A1 SYSTEM AND METHOD FOR ESTIMATING MATERIAL DENSITY 公开/授权日:2016-06-09
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