Invention Grant
- Patent Title: System architecture for wireless metrological devices
-
Application No.: US14571973Application Date: 2014-12-16
-
Publication No.: US10193979B2Publication Date: 2019-01-29
- Inventor: John Brandon Laflen , Glen William Brooksby , Patrick Jay Biel , Yakov Polishchuk , Steven William Wik
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent John P. Darling
- Main IPC: H04L29/08
- IPC: H04L29/08 ; H04B7/26 ; H04W4/80

Abstract:
System architecture that provides computer-based methods of wireless communication between a wireless metrological device and a mobile computing device that includes the sending/receiving of data (e.g., measurements) along with a universal generic data service that includes data descriptor(s) affiliated with the measurements. The architecture and methods, which may be communicated via BLE, allow for uniform communication between tools and mobile computing devices regardless of tool type, manufacturer, and measurement information.
Public/Granted literature
- US20160173608A1 SYSTEM ARCHITECTURE FOR WIRELESS METROLOGICAL DEVICES Public/Granted day:2016-06-16
Information query