Invention Grant
- Patent Title: Method for reading data stored in a flash memory according to a voltage characteristic and memory controller thereof
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Application No.: US15852847Application Date: 2017-12-22
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Publication No.: US10199110B2Publication Date: 2019-02-05
- Inventor: Tsung-Chieh Yang
- Applicant: Silicon Motion, Inc.
- Applicant Address: TW Jhubei
- Assignee: Silicon Motion, Inc.
- Current Assignee: Silicon Motion, Inc.
- Current Assignee Address: TW Jhubei
- Agency: Wang Law Firm, Inc.
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/26 ; G11C16/34 ; G11C16/04 ; G11C16/16 ; G11C16/10

Abstract:
A method for reading data stored in a flash memory. The flash memory comprises a plurality of memory cells and each memory cell has a particular threshold voltage. The method includes: obtaining a first threshold voltage distribution representing threshold voltages of a first group of the memory cells; obtaining a second threshold voltage distribution representing threshold voltages of a second group of the memory cells, wherein the second threshold voltage distribution is different from the first threshold voltage distribution, and the first group of the memory cells comprises at least a part of the second group of the memory cells; and controlling the flash memory to perform at least one read operation upon the first group of the memory cells according to the second threshold voltage distribution.
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