Invention Grant
- Patent Title: Electron microscope and method for transmission electron microscopy imaging of sample arrays
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Application No.: US15326530Application Date: 2014-07-17
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Publication No.: US10199198B2Publication Date: 2019-02-05
- Inventor: Claude Dufresne , Holger Eickhoff
- Applicant: Scienion AG
- Applicant Address: DE Berlin
- Assignee: Scienion AG
- Current Assignee: Scienion AG
- Current Assignee Address: DE Berlin
- Agency: Caesar Rivise, PC
- International Application: PCT/EP2014/001953 WO 20140717
- International Announcement: WO2016/008502 WO 20160121
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01N1/31 ; H01J37/18 ; G01N1/30 ; G01N35/10 ; G01N1/28

Abstract:
A method of electron microscopy imaging of samples, using an electron microscope (100) having a microscope column (10) and a transfer device (11) with a grid carriage (12), comprises the steps of preparing multiple samples (1) on a single electron microscopy grid (2), including dispensing the samples (1) with a dispenser device (30) on distinct positions on the grid (2), introducing the grid (1) with the transfer device (11) into the microscope column (10), and electron microscopy imaging of the samples (1), wherein the preparing step includes holding the grid (2) on the grid carriage (12) of the transfer device (11) or on a grid holder device (20) provided at the electron microscope (100) and dispensing the samples (1) on the grid (2) while holding it on the grid carriage (12) or on the grid holder device (20). Furthermore, an electron microscope (100) for electron microscopy imaging of samples is described.
Public/Granted literature
- US20170207062A1 ELECTRON MICROSCOPE AND METHOD FOR TRANSMISSION ELECTRON MICROSCOPY IMAGING OF SAMPLE ARRAYS Public/Granted day:2017-07-20
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