Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US15258138Application Date: 2016-09-07
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Publication No.: US10199328B2Publication Date: 2019-02-05
- Inventor: Chan Sic Yoon , Ki Seok Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse P.C.
- Priority: KR10-2016-0001526 20160106
- Main IPC: H01L23/535
- IPC: H01L23/535 ; H01L23/485 ; H01L29/06 ; H01L29/423 ; H01L27/108

Abstract:
A semiconductor device includes a first contact plug on a substrate, a first lower electrode disposed on the first contact plug and extended in a thickness direction of the substrate, a first supporter pattern on the first lower electrode and including an upper surface and a lower surface, the upper surface of the first supporter pattern being higher than a top surface of the first lower electrode, a dielectric film on the first lower electrode, the upper surface of the first supporter pattern and the lower surface of the first supporter pattern and an upper electrode disposed on the dielectric film.
Public/Granted literature
- US20170194261A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2017-07-06
Information query
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