Invention Grant
- Patent Title: RRM measurement method and apparatus in TDD system
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Application No.: US15280002Application Date: 2016-09-29
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Publication No.: US10206133B2Publication Date: 2019-02-12
- Inventor: Tong Wu , Anjian Li
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Staas & Halsey LLP
- Main IPC: H04J3/00
- IPC: H04J3/00 ; H04W24/10 ; H04L5/14 ; H04W72/04

Abstract:
The present disclosure provides an RRM measurement method and apparatus in a TDD system, so as to resolve a current problem that in a process of an inter-frequency measurement or an inter-RAT measurement in a TDD system, UE cannot perform an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0. In embodiments of the present disclosure, UE performs an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0 by using a corresponding RRM measurement method according to measurement indication information that is carried in an RRM measurement message delivered by a network device. By means of the technical solutions in the present disclosure, UE can perform an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0 by using an RRM measurement method.
Public/Granted literature
- US20170019810A1 RRM MEASUREMENT METHOD AND APPARATUS IN TDD SYSTEM Public/Granted day:2017-01-19
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