Invention Grant
- Patent Title: Apparatus for measuring ion mobility of harmful material and reference data obtaining method of the same
-
Application No.: US15323317Application Date: 2015-11-26
-
Publication No.: US10209220B2Publication Date: 2019-02-19
- Inventor: Myoung Choul Choi , Jeong-Hoon Kang , Jung-Hwan Kim
- Applicant: Korea Basic Science Institute
- Applicant Address: KR Cheongju-si, Chungcheongbuk-do
- Assignee: Korea Basic Science Institute
- Current Assignee: Korea Basic Science Institute
- Current Assignee Address: KR Cheongju-si, Chungcheongbuk-do
- Agency: McAndrews, Held & Malloy, Ltd.
- Priority: KR10-2015-0166108 20151126
- International Application: PCT/KR2015/012767 WO 20151126
- International Announcement: WO2017/090792 WO 20170601
- Main IPC: G01N27/62
- IPC: G01N27/62 ; H01J49/16 ; H01J49/00 ; G01N27/64

Abstract:
Provided are an apparatus for measuring an ionic mobility of a harmful material and a reference data obtaining method thereof. The method includes obtaining a measurement signal by detecting a charge of an ion between electrodes, obtaining a noise signal by insulating the electrodes from the ion, aligning the noise signal with the measurement signal, removing a part of the measurement signal aligned with the noise signal, and calculating reference data from a remaining part of the measurement signal.
Public/Granted literature
- US20180275098A1 APPARATUS FOR MEASURING ION MOBILITY OF HARMFUL MATERIAL AND REFERENCE DATA OBTAINING METHOD OF THE SAME Public/Granted day:2018-09-27
Information query