- 专利标题: Testing system for optical aiming systems with light emitter systems including testing system for thermal drift and related methods
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申请号: US15435348申请日: 2017-02-17
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公开(公告)号: US10215531B2公开(公告)日: 2019-02-26
- 发明人: Matthew Thurner , Brandon Clarke , Ronald A Volpone , David Scot Curry
- 申请人: The United States of America as represented by the Secretary of the Navy
- 申请人地址: US DC Washington
- 专利权人: The United States of America, as represented by the Secretary of the Navy
- 当前专利权人: The United States of America, as represented by the Secretary of the Navy
- 当前专利权人地址: US DC Washington
- 代理商 Christopher A. Monsey
- 主分类号: F41G1/54
- IPC分类号: F41G1/54 ; G01M99/00
摘要:
Exemplary testing systems and methods are provided including a system configured to test for thermal drift of a unit under test (UUT) under various temperature or environmental conditions and generating an output including visual or data on the thermal drift, if any. The methods involve attaching a UUT to a mounting device within a thermally controlled chamber, collimating light received from a UUT, recording the resulting images, and comparing the results at different temperatures to determine how much thermal drift has occurred. In addition, there are testing apparatuses capable of performing the tests.
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