发明授权
- 专利标题： Method and device for improving the SAFT analysis when measuring irregularities
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申请号： US14761833申请日： 2013-10-23
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公开(公告)号： US10222352B2公开(公告)日： 2019-03-05
- 发明人: Hubert Mooshofer
- 申请人： SIEMENS AKTIENGESELLSCHAFT
- 申请人地址： DE Munich
- 专利权人： SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人： SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人地址： DE Munich
- 代理机构： Slayden Grubert Beard PLLC
- 优先权： DE102013201975 20130207
- 国际申请： PCT/EP2013/072181 WO 20131023
- 国际公布： WO2014/121858 WO 20140814
- 主分类号： G01N29/04
- IPC分类号： G01N29/04 ; G01N29/24 ; G01N29/34 ; G01N29/44 ; G01S15/89 ; G01N29/06 ; G01N29/26 ; G01N29/265 ; G01S7/52
摘要：
The invention relates to a method and to a corresponding device in which irregularities regarding each detected measurement position within a measurement surface are detected using a local measurement density. Each echo signal received in response to each detected measurement position is then weighted in order to generate an image using a data processing device such that the irregularities are adjusted.
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