Invention Grant
- Patent Title: Rapid fault detection method and device
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Application No.: US15136690Application Date: 2016-04-22
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Publication No.: US10223183B2Publication Date: 2019-03-05
- Inventor: Junyong Xie , Tao Liu , Hai Xia
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: CN201310507154 20131024
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F9/455

Abstract:
A method for quickly detecting a fault includes: detecting, by a Kernel Black Box KBox set, a fault occurred in an operation system; and generating, by the KBox set, fault information based on the detected fault; and transmitting, by the KBox set, system fault notification information including the fault information to an application high availability HA subsystem via a management unit of an infrastructure layer, to trigger a service fault processing of the application HA subsystem. Thus, the fault or unhealthiness of an OS is detected rapidly and a service application layer is timely notified to process the fault, thus reducing service loss.
Public/Granted literature
- US20160239369A1 RAPID FAULT DETECTION METHOD AND DEVICE Public/Granted day:2016-08-18
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