Invention Grant
- Patent Title: Detection circuit, method for recognizing structural features, and display substrate
-
Application No.: US15568050Application Date: 2017-03-31
-
Publication No.: US10229307B2Publication Date: 2019-03-12
- Inventor: Xiaoliang Ding , Xue Dong , Haisheng Wang , Xiaochuan Chen , Yingming Liu , Shengji Yang
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Calfee, Halter & Griswold LLP
- Priority: CN201610439882 20160617
- International Application: PCT/CN2017/078937 WO 20170331
- International Announcement: WO2017/215316 WO 20171221
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/40 ; H01L27/32 ; H01L27/146 ; G09G3/3208

Abstract:
The detection circuit for recognizing a feature structure includes a sensing sub-circuit and a processing sub-circuit; the sensing sub-circuit is configured to output a first signal containing only noise information of the sensing sub-circuit to the processing sub-circuit, and the sensing sub-circuit is also configured to sense the feature structure to obtain a second signal containing information of the feature structure and output a third signal comprising a first signal and a second signal to the processing sub-circuit, and the processing sub-circuit is configured to perform differencing on the first signal and the third signal to output the second signal.
Public/Granted literature
- US20180218193A1 DETECTION CIRCUIT, METHOD FOR RECOGNIZING STRUCTURAL FEATURES, AND DISPLAY SUBSTRATE Public/Granted day:2018-08-02
Information query