Invention Grant
- Patent Title: Method of forming nitride semiconductor substrate and method of fabricating semiconductor device
-
Application No.: US15656305Application Date: 2017-07-21
-
Publication No.: US10229831B2Publication Date: 2019-03-12
- Inventor: Youngjo Tak , Sammook Kang , Mihyun Kim , Junyoun Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2016-0172827 20161216
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
A method of fabricating a nitride semiconductor substrate including forming a buffer layer on a surface of a growth substrate, growing a first nitride semiconductor layer on the buffer layer, growing a second nitride semiconductor layer on the first nitride semiconductor layer, and removing the growth substrate may be provided. The forming a buffer layer may deform the surface of the growth substrate to have a convex shape. The forming a buffer layer and the growing a first nitride semiconductor layer may be performed within a first process chamber. The growing a second nitride semiconductor layer and the removing the growth substrate may be performed within a second process chamber.
Public/Granted literature
- US20180174822A1 METHOD OF FORMING NITRIDE SEMICONDUCTOR SUBSTRATE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE Public/Granted day:2018-06-21
Information query
IPC分类: