Invention Grant
- Patent Title: Position measurement system and position measurement method
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Application No.: US15027547Application Date: 2015-10-15
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Publication No.: US10233615B2Publication Date: 2019-03-19
- Inventor: Hiroyoshi Yamaguchi , Taiki Sugawara , Shun Kawamoto
- Applicant: Komatsu Ltd.
- Applicant Address: JP Tokyo
- Assignee: Komatsu Ltd.
- Current Assignee: Komatsu Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Locke Lord LLP
- International Application: PCT/JP2015/079240 WO 20151015
- International Announcement: WO2016/013691 WO 20160128
- Main IPC: B60R11/04
- IPC: B60R11/04 ; H04N7/18 ; E02F9/26 ; G06T1/00 ; G01C21/16 ; G06T7/00

Abstract:
A position measurement system includes: at least a pair of imaging devices mounted on a work machine; a calculation unit provided at the work machine and configured to perform stereo measurement by using information of an image of an object captured by at least the pair of imaging devices; and a determination unit configured to determine condition related to image capturing by the imaging device based on a performance result of the stereo measurement.
Public/Granted literature
- US20170107698A1 POSITION MEASUREMENT SYSTEM AND POSITION MEASUREMENT METHOD Public/Granted day:2017-04-20
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