Invention Grant
- Patent Title: Test equipment arrangement having a superheat controller
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Application No.: US15265798Application Date: 2016-09-14
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Publication No.: US10234409B2Publication Date: 2019-03-19
- Inventor: Arvind Rao , Chen Yang , Jennifer O'Keefe , Buu Chung
- Applicant: DunAn Microstaq, Inc.
- Applicant Address: US TX Austin
- Assignee: DunAn Microstaq, Inc.
- Current Assignee: DunAn Microstaq, Inc.
- Current Assignee Address: US TX Austin
- Agency: MacMillan, Sobanski & Todd, LLC
- Main IPC: F25B49/02
- IPC: F25B49/02 ; G01N25/00 ; G01M99/00
Abstract:
A test equipment arrangement includes a superheat controller configured for connection to a unit under test, and further configured to test at least one operational parameter of the unit under test.
Public/Granted literature
- US20170082336A1 TEST EQUIPMENT ARRANGEMENT HAVING A SUPERHEAT CONTROLLER Public/Granted day:2017-03-23
Information query
