Invention Grant
- Patent Title: HHG source, inspection apparatus and method for performing a measurement
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Application No.: US15487558Application Date: 2017-04-14
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Publication No.: US10234771B2Publication Date: 2019-03-19
- Inventor: Nan Lin , Arie Jeffrey Den Boef , Sander Bas Roobol , Simon Gijsbert Josephus Mathijssen , Niels Geypen
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V
- Current Assignee: ASML Netherlands B.V
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP16167512 20160428
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G01B11/24 ; G02F1/355 ; G02F1/37 ; H01S3/00 ; H01S3/13 ; H01S3/16 ; G01N21/95

Abstract:
Disclosed is a method of performing a measurement in an inspection apparatus, and an associated inspection apparatus and HHG source. The method comprises configuring one or more controllable characteristics of at least one driving laser pulse of a high harmonic generation radiation source to control the output emission spectrum of illumination radiation provided by the high harmonic generation radiation source; and illuminating a target structure with said illuminating radiation. The method may comprise configuring the driving laser pulse so that the output emission spectrum comprises a plurality of discrete harmonic peaks. Alternatively the method may comprise using a plurality of driving laser pulses of different wavelengths such that the output emission spectrum is substantially monochromatic.
Public/Granted literature
- US20170315456A1 HHG Source, Inspection Apparatus and Method for Performing a Measurement Public/Granted day:2017-11-02
Information query
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