Invention Grant
- Patent Title: Measurement system, measurement method, and vision chip
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Application No.: US14850181Application Date: 2015-09-10
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Publication No.: US10240915B2Publication Date: 2019-03-26
- Inventor: Ryuji Fuchikami
- Applicant: Panasonic Intellectual Property Corporation of America
- Applicant Address: US CA Torrance
- Assignee: Panasonic Intellectual Property Corporation of America
- Current Assignee: Panasonic Intellectual Property Corporation of America
- Current Assignee Address: US CA Torrance
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2014-043467 20140306; JP2014-240115 20141127
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B11/25

Abstract:
A measurement system includes: a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image.
Public/Granted literature
- US20160054118A1 MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND VISION CHIP Public/Granted day:2016-02-25
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