• 专利标题: Measuring device for measuring the dielectric and / or magnetic properties of a sample by means of a microwave transmission measurement, apparatus using such a measuring device, and method using such an apparatus
  • 申请号: US15749738
    申请日: 2016-07-28
  • 公开(公告)号: US10247681B2
    公开(公告)日: 2019-04-02
  • 发明人: Albert Klein
  • 申请人: Elisabeth Katz
  • 申请人地址: DE Simmersfeld
  • 专利权人: ELISABETH KATZ
  • 当前专利权人: ELISABETH KATZ
  • 当前专利权人地址: DE Simmersfeld
  • 代理机构: Birch, Stewart, Kolasch & Birch, LLP
  • 优先权: DE102015010300 20150807
  • 国际申请: PCT/EP2016/067999 WO 20160728
  • 国际公布: WO2017/025340 WO 20170216
  • 主分类号: G01N22/04
  • IPC分类号: G01N22/04 G01N22/00
Measuring device for measuring the dielectric and / or magnetic properties of a sample by means of a microwave transmission measurement, apparatus using such a measuring device, and method using such an apparatus
摘要:
A microwave measuring device having a transmitting module and a receiving module and an apparatus having these modules are described. The two modules are accommodated either in a common housing or in separate housings. The transmitting module can be coupled to a transmitting antenna and the receiving module can be coupled to a receiving antenna. In order to compensate for measurement errors, in particular temperature-related measurement errors, at least one RF bypass cable runs outside the housing/the housings and can be used to couple the transmitting module and the receiving module while bridging the measuring section defined by the two antennas.
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