Invention Grant
- Patent Title: Inspection device utilizing eddy currents
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Application No.: US15375557Application Date: 2016-12-12
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Publication No.: US10247703B2Publication Date: 2019-04-02
- Inventor: Kevin D. Smith , Jonathan P. Sullivan , David A. Raulerson
- Applicant: United Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Farmington
- Agency: Carlson, Gaskey & Olds, P.C.
- Main IPC: G01N27/90
- IPC: G01N27/90 ; G01B7/14 ; G01M15/14

Abstract:
An exemplary method of inspecting a component includes, among other things, securing an inspection probe body relative to a component, using a sensor assembly housed within the inspection probe body to induce an eddy current in a target area of the component, the target area having a target surface that is spaced from the sensor assembly, sensing a parameter of the eddy current in the component using the sensor assembly, and determining a position of the target surface of the component relative to the inspection probe body using the parameter of eddy current from the sensing.
Public/Granted literature
- US20170122910A1 INSPECTION DEVICE UTILIZING EDDY CURRENTS Public/Granted day:2017-05-04
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