Inspection device utilizing eddy currents
Abstract:
An exemplary method of inspecting a component includes, among other things, securing an inspection probe body relative to a component, using a sensor assembly housed within the inspection probe body to induce an eddy current in a target area of the component, the target area having a target surface that is spaced from the sensor assembly, sensing a parameter of the eddy current in the component using the sensor assembly, and determining a position of the target surface of the component relative to the inspection probe body using the parameter of eddy current from the sensing.
Public/Granted literature
Information query
Patent Agency Ranking
0/0