Invention Grant
- Patent Title: Abnormality detection apparatus, control method, and program
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Application No.: US14900718Application Date: 2014-03-06
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Publication No.: US10255114B2Publication Date: 2019-04-09
- Inventor: Masato Asahara , Kazuyo Narita , Jianquan Liu
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2013-136427 20130628
- International Application: PCT/JP2014/055844 WO 20140306
- International Announcement: WO2014/208139 WO 20141231
- Main IPC: H04L12/24
- IPC: H04L12/24 ; G06F9/50 ; G06F11/34 ; H04L12/26 ; H04L29/08

Abstract:
An abnormality detection apparatus (2000) handles tasks allocated to a plurality of processing servers (3200) as processing targets in a distribution system (3000) having the processing servers (3200). A history acquisition unit (2020) acquires progress history information which is information regarding progress of the plurality of tasks at a plurality of time point of recording. A target range determination unit (2040) determines a target range. A distribution calculation unit (2060) calculates a task speed distribution which is a probability distribution of processing speeds of the tasks using the progress history information regarding the plurality of tasks. An abnormality determination unit (2080) compares a processing speed of a task to be determined with the task speed distribution to thereby determine whether or not the processing speed of the task to be determined is abnormal.
Public/Granted literature
- US20160132359A1 ABNORMALITY DETECTION APPARATUS, CONTROL METHOD, AND PROGRAM Public/Granted day:2016-05-12
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