Invention Grant
- Patent Title: Raman spectrum-based object inspection apparatus and method
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Application No.: US15827209Application Date: 2017-11-30
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Publication No.: US10260949B2Publication Date: 2019-04-16
- Inventor: Huacheng Feng , Yumin Yi , Hongqiu Wang , Rui Fan , Shixin Zhang
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Beijing
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: CN201611219313 20161226
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J5/00 ; G01N21/65 ; G08B21/02 ; G01N21/95 ; G06T7/00

Abstract:
A Raman spectrum-based object inspection apparatus and a Raman spectrum-based object inspection method are disclosed. In one aspect, an example apparatus includes: a laser device configured to emit a laser; an optical guiding device configured to guide the laser to an object to be detected and collect a Raman scattering light from the object. The apparatus includes a spectrum generator configured to receive the Raman scattering light collected by the optical guiding device and generate a Raman spectroscopic signal. The spectrum analyzer is configured to analyze the Raman spectroscopic signal to obtain an inspection result. The apparatus includes a monitoring device configured to monitor a state of the object and control an object inspection operation depending on the state of the object.
Public/Granted literature
- US20180180482A1 RAMAN SPECTRUM-BASED OBJECT INSPECTION APPARATUS AND METHOD Public/Granted day:2018-06-28
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