- Patent Title: Method and system for articulation of a visual inspection device
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Application No.: US15182207Application Date: 2016-06-14
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Publication No.: US10262404B2Publication Date: 2019-04-16
- Inventor: Nicholas Anthony Stancato , Melissa Rose Stancato , Kevin Andrew Coombs , Joseph John Waclawski , James J. Delmonico , Bryan David Maule , Dennis Lavin , Matthew William Pankow
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G06T7/00 ; H04N5/232 ; G02B23/24

Abstract:
Methods, systems, and computer-readable media for articulating visual inspection devices are provided. For example, a method can include receiving an inspection template by a control system associated with the visual inspection device. The inspection template can include data associated with at least one point of interest in a scene viewable to the visual inspection device. The method can further include generating, by the control system, an articulation path based on the data. The method can also include actuating an electro-mechanical system of the visual inspection device according to the articulation path.
Public/Granted literature
- US20170358072A1 Method and System for Articulation of a Visual Inspection Device Public/Granted day:2017-12-14
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