Invention Grant
- Patent Title: Command sequence for first read solution for memory
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Application No.: US15440185Application Date: 2017-02-23
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Publication No.: US10262743B2Publication Date: 2019-04-16
- Inventor: Idan Alrod , Eran Sharon , Alon Eyal , Liang Pang , Evgeny Mekhanik
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C16/26 ; G11C16/34 ; G11C16/08 ; G11C16/04

Abstract:
Techniques are provided for improving the accuracy of read operations of memory cells, where the threshold voltage of a memory cell can shift depending on when the read operation occurs. A command is issued for performing a conditioning operation which helps to transition the memory cells so that their threshold voltages are at predictable levels. In one approach, the conditioning operation is performed by applying a voltage pulse to one or more word lines in response to a trigger, such as detecting that a duration since a last sensing operation exceeds a threshold, detecting that a duration since a last performance of the conditioning operation exceeds a threshold, or a detecting that a read command has been issued. Moreover, the peak power consumption required to perform the conditioning operation can be reduced for various configurations of a memory device on one or more die.
Public/Granted literature
- US20180114580A1 Command Sequence For First Read Solution For Memory Public/Granted day:2018-04-26
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