Invention Grant
- Patent Title: Subjective optometry apparatus and subjective optometry program
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Application No.: US15694235Application Date: 2017-09-01
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Publication No.: US10264967B2Publication Date: 2019-04-23
- Inventor: Michihiro Takii , Masaaki Hanebuchi , Noriji Kawai
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Gamagori
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Gamagori
- Agency: Oliff PLC
- Priority: JP2016-173089 20160905; JP2016-173090 20160905; JP2017-069850 20170331
- Main IPC: A61B3/18
- IPC: A61B3/18 ; A61B3/00 ; A61B3/02 ; A61B3/10

Abstract:
A subjective optometry apparatus includes subjective measurement unit for subjectively measuring an optical characteristic of a subject eye, the subjective measurement unit including a calibration optical system that is disposed in an optical path of a light projecting optical system projecting a visual target luminous flux toward the subject eye and changes an optical characteristic of the visual target luminous flux. The subjective optometry apparatus includes objective measurement unit for objectively measuring the optical characteristic of the subject eye, the objective measurement unit including a measurement optical system that emits measurement light to a fundus of the subject eye and receives reflected light of the measurement light. The subjective optometry apparatus includes controller for objectively measuring the optical characteristic of the subject eye by the objective measurement unit while the optical characteristic of the subject eye is subjectively measured by the subjective measurement unit.
Public/Granted literature
- US20180064339A1 SUBJECTIVE OPTOMETRY APPARATUS AND SUBJECTIVE OPTOMETRY PROGRAM Public/Granted day:2018-03-08
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